Denver, CO - Jan. 17, 2013 - Merrick's Matt Bethel, GISP, Director of Technology, will present at the International LiDAR Mapping Forum (ILMF)13 Conference held 2/11 - 2/13 in Denver, Colorado. Bethel's presentation on "Automated LiDAR Quality Control" will be in the Centennial Ballroom ABC in the Hyatt Regency Denver at Colorado Convention Center at 4 PM Tuesday, February 12. Bethel's talk will focus on his detailed understanding of industry quality control (QC) standards and relevant QC approaches. In addition, he will provide insight into the automated LiDAR QC tools, which are used to verify compliance to a project's design specifications for accuracy standards and the completeness of data deliverables.

According to Bethel, utilizing the recent release of the LiDAR Base Specification Version 1.0 from the National Geospatial Program (NGP) within the US Geological Survey (USGS) means many airborne data acquisition projects in the US have leveraged this specification to support their LiDAR data acquisition activities. "While the primary intent of the USGS' LiDAR specification is to enforce compliance to a single specification for the USGS and create consistency across all of the USGS funded LiDAR projects, most data recipients do not have a sufficient QC workflow or QC tools to fully review all of the LiDAR data deliverables," said Bethel. "Utilizing an effective automated QC approach may significantly impact the overall success of elevation projects across the country," he added. "The goal of this presentation will be to show how LiDAR data can be tested against this specification, and done so in its entirety, not just upon representative samples."

Merrick is an established airborne data acquisition vendor that stays on the leading edge of products, services, and programs using current and emerging geospatial technologies. The firm's clients range from defense and intelligence agencies to local and state government, energy, and water resources organizations.

Merrick's Geospatial will be exhibiting at the ILMF Conference at Booth #45.