With this upgrade, ALTM-NAV users will be able to plan airborne missions more
effectively and efficiently using ancillary DEM information from a variety of sources.
Since mission success is often gauged by the ability to collect complete data in the
most efficient manner possible, an underlying DEM will enable planners to be aware
of topographical changes that may affect swath widths and resultant planned flightline overlaps.

Similarly, realtime projection of the lidar data onto the underlying DEM will enable
system operators to verify coverage in the air more effectively before leaving the
survey site to return to base.

“We are excited to offer new ways of allowing our customers to maximize their
efficiencies,” said Michael Sitar, Optech Product Manager for Airborne Survey
Products. “Minimizing air time and ensuring data coverage are big parts of that. And
DEM support paves the way,”

About Optech
Optech is the world leader in the development, manufacture and support of advanced laser-based survey instruments. We offer client-driven lidar solutions in airborne terrestrial mapping, airborne laser bathymetry, laser imaging, mine cavity monitoring, industrial process control and space-qualified sensors for orbital operations and planetary exploration.

www.optech.ca